Parametric Test Equipment
It supports parallel tests up to 4 . As a result, it more
quickly verifies the electrical properties of the wafers.
- World class wafer property testing
- The equipment consists of 4 sub-frames.
Each sub-frame operates independently
- SMUs available for installation up to 32
- Guarded switching matrix measurement pins supported
(48 to 104 pins)
- Available for use in combination of various external